Zvi Lapidot, Ehud Tirosh & Oded Arnon: Apparatus and Method for Augmented Reality. 
United States Patent No.: 10962778 B2, by Veeride Ltd, Mar. 30, 2021.

​

Oded Arnon: "Lenses On Diet – Desensitizing Lenses". Presented at the OASIS 7th Conference on Optics and Electro-Optics, Tel-Aviv, Israel, 1-2 April 2019. 

 

O. Arnon, "The effect of the gross-optical-power on the tolerances of a lens", invited paper, presented in the Optical Engineering Conference, Jerusalem, Israel (2010). 

 

G .Almogy, B.C. Bolt, O. Arnon, B. Kenan, E.  Tirosh & M. Corliss: Automated Optical Inspection using Multiple Objectives.  United States Patent Application Pub. NO.: US 2006/0170910 A1, by Applied Materials Israel Ltd, Aug. 3, 2006. 

I. Lipshitz, A. D. Sadeh, G. Dotan, E. Aharoni, Y. Gross, O. Arnon, & A. Loewenstein, "Design and Optical Performance of an Implantable Miniaturized Telescope (IMT™)," in Vision Science and its Applications, OSA Technical Digest (Optical Society of America, 2000), paper PD6.

 

Arnon, O. & Fisch, D. (2000). System and method for inspecting surfaces of articles. 

A patent application by Orbotech Ltd  in Taiwan. 

 

Feldman, Haim & Arnon, Oded. (1999). A new focal sensor for laser scanning wafer inspection system. Presented at the 11th Israeli  Optical Engineering Meeting, Tel-Aviv,
11 Nov. 1999. 

 

Katzir, Y., Teichman, E,.Ginossar, I., Negry, S., Gross, A. & O. Arnon (2000). Illumination for inspecting substantially flat surfaces. United States Patent Application No.PCT/IL98/00285 By Orbotech Ltd, June 16, 1998.  

 

Arnon, O., Katzir, Y. (1994) A systematic approach for analyzing an illumination system. Presented at the 9th Meeting on Optical Engineering in Israel, Tel-Aviv, October, 1994. 

 

Katzir, Y., Arnon, O. & Teichman, E.  Optical inspection apparatus and illumination system particularly useful therein. United States Patent No. 5,153,668 By Orbotech Ltd, Oct. 6 ,1992. 

​

Arnon, O. , Bloomberg, S. & D. Ophir (1988). Computer generated hologram used as an aberration corrector. Presented at the 6th Meeting on Optical Engineering In Israel, Tel-Aviv, Oct. 1989.  Published at the SPIE proceedings Vol. 1038.   

 

Rosenberg, A., Shiloh, K., Arnon, O. & G. Mori (1987). Non-Destructive testing of rubber liners by projection moiré. Presented at the SPIE Conference, San-Diego, California, August, 1987. 

 

Naor, D., Arnon, O. & Avnur, A. (1987). A lightweight innovative helmet airborne display and sight (HADAS). Presented at the SPIE Conference, Orlando, Florida,  17-22 May, 1987. 

 

Arnon, O. (1985). Achromatic doublet made of refractive and holographic elements. Presented at The International Lens Design Conference, Organized by the Optical Society of America, Cherry Hill, New Jersey,13 June, 1985. 

 

Arnon, O. & Chou, T. J. (1982). Wide band measurement of the refrective index of optical thin films during their deposition. Thin Solid Films, 91, 23-31. 

Also presented at  the Fifth International Thin Films Congress, Herzlia-on-Sea, September 21-25, 1981, Israel. 

 

Arnon, O. & Baumeister, P. (1980). Electric field distribution and the reduction of laser damage in multilayers. Applied Optics, Vol. 19, No. 11, 1853-1855. 

 

Arnon, O. & Baumeister, P. (1978). Versatile high-precision multiple-pass reflectometer. Applied Optics, Vol. 17, No. 18, 2913-2916. 

 

Arnon, O. (1977). Loss mechanisms in dielectric optical interference devices. Applied Optics, Vol. 16, No. 8, 2147-2151. 

 

Baumeister, P. & Arnon, O. (1977). Use of hafnium dioxide in multilayer dielectric reflectors for the near UV. Applied Optics, Vol. 16, No. 2, 439-444. 

 

"Loss Mechanisms In Optical Interference Dielectric Coatings"; Ph.D. Dissertation; Supervised by Prof. Philip Baumeister; The Institute of Optics University of Rochester, Rochester New-York (1978).  

 

"Zeeman Effect in He-Ne Laser" ; M.SC Dissertation ; Supervised by Prof. David Treves, The Weizmann Institute of Science, Rehovoth, Israel (1973).